Scanning Near-Field Optical Microspectrometer general information
Scanning Near-Field Optical Microspectrometer
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The NFS Series of scanning near-field optical microspectrometers have been optimized as a new solution for nanotechnology applications. Traditionally, characterization methods on the nanometer scale consist of topography observation using an electron or scanning probe microscope or elemental analysis using an x-ray microanalyzer. These methods deliver images with high spatial resolution but they cannot obtain chemical information from a sample surface. On the other hand, traditional FT-IR, photoluminescence, or Raman microspectroscopy instruments can provide chemical data for a sample, but the spatial resolution is determined by the diffraction limit of light, limited to the wavelength of the light used. Scanning near-field microspectrometers allows characterization at the extreme nano level range exceeding the diffraction limit of light. Introducing light into a fiber probe with an aperture of a hundred to several hundred nm produces near-field light of the same size as the probe aperture. Bringing the sample close to the probe aperture (within 100 nm) allows spectroscopic observations with a spatial resolution of several hundred nm as a result of the interaction of the near-field light with the sample surface.
- Integrated scanning near-field microspectrometer systems.
- Spectroscopic measurements with spatial resolutions between a hundred to several hundred nm.
- JASCO near-field probes provide reproducible spectral measurements and are available with specified dimensions.
- Topographical measurement of sample features with simultaneous spectral measurements.
- Can support illumination-collection, collection, and illumination (transmission) modes.