FT-IR  ·  Microscopy

Microscopy

Microscopy general information



FT-IR related products and software

FT-IR accessories

A full range of accessories is available, including:

The IRT-5000 Infrared microscope

The IRT-5000 FT-IR microscope employs a mid-band MCT detector as standard, while up to two detectors can be simultaneously installed as an option. The standard “IQ Mapping” function allows multi-point, line, area and ATR mapping experiments without moving the sample stage, in addition to single-point measurements. An optional automatic X-Y-Z sample stage enables auto-focus and mapping analysis of larger sample areas.

  • IQ Mapping
  • Dual detector capability
  • Variety of measurement modes
  • (Transmission, reflection, ATR, Grazing Angle Reflectance)
  • Multiple objective capabilities
  • Field upgrade to IR Imaging using a linear array detector

The IRT-7000 multi-channel FT-IR microscope

The IRT-7000 multi-channel FTIR microscope offers two detectors as standard, a 16-channel linear array detector and a single-point MCT detector. The combination of the standard automatic sample stage and "IQ Mapping" function allows mapping analyses of a large sample area, multi-area ATR mapping, and IR imaging of a specific area with extremely high spatial resolution and excellent sensitivity in a short time.

The Irtronµ in-compartment microscopy system

The Irtronµ in-compartment microscopy system is designed to provide affordable analysis of microscopic samples.

With the high performance features of an external FT-IR microscope accessory. The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 Series FT-IR instruments.

The Clear-View Series of FT-IR Microscope ATR Objectives

Sample viewing function during a sample in contact with ATR crystal

The innovative “Clear-View” ATR objectives permit both ATR data collection and viewing of the sample by using the same cassegrain elements, simply changing the crystal position up and down.

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