The Clear-View Series of FT-IR Microscope ATR Objectives general information
The Clear-View Series of FT-IR Microscope ATR Objectives
Microscopy general information
The “Clear-View” series of Micro FT-IR ATR objectives for the IRT-5000/7000, the ATR-5000-SD (with diamond crystal), ATR-5000-SS (with zinc sulfide crystal) and ATR-5000-SG (with germanium crystal) are available for micro ATR measurements. These three objectives permit both ATR data collection and viewing of the sample by using the same cassegrain elements, simply changing the crystal position up and down.
In addition, the ATR-5000-SD and ATR-5000-SS enables a simultaneous sample view even during ATR data collection after the ATR crystal element contacts the sample, a capability that conventional ATR objectives cannot provide. This innovative function allows you to select a specific area of the sample, while observing the entire area of the sample that is in contact with the crystal element.
|Normal sample view with the crystal element in the raised position||Sample viewing after crystal contact with the sample area||ATR measurement and simultaneous sample viewing|
|The ATR-5000-SD, ATR-5000-SS, and ATR-5000-SG enables sample viewing by setting the ATR crystal in the raised position.||The ATR-5000-SD and ATR-5000-SS enable sample viewing through the ATR crystal after contact with the sample surface.||The ATR-5000-SD and ATR-5000-SS ATR objectives provide simultaneous sample view during ATR data collection.|
Multi-point ATR measurement of fingernail polish using the ATR-5000-SS
Figure 1 is the sample image of fingernail polish applied to a flat metal substrate, as viewed through the ATR-5000-SS with the crystal in the raised, or view, position. The fingernail polish is impregnated with 'glitter' particles, which provide a highlight in the fingernail polish.
Figure 2 is the sample image after contact of the ATR crystal with the sample surface. The green squares indicate the sampling points to be measured with the multi-point ATR method. While viewing the sample area during contact with the ATR crystal, specific sample sites can be selected without removing the crystal from the sample surface or switching to another objective.
The JASCO IQ Mapping software allows single-point, multi-point, line mapping or grid mapping measurements of any sample in contact with the ATR objective without moving the sample stage or ATR objective. Conventional ATR objectives can only provide sample measurements at the immediate center of the crystal, requiring movement of the ATR objective and sample stage for data collection of multiple sampling sites.
Figure 3 illustrates the sample spectra results using the IQ Mapping function. The 'Base' area provides a spectrum of the polish pigment and the 'glitter' area spectrum indicates a silica compound as the major component of the glitter particle.