Visitor:
|
FT/IR-4100 and FT/IR-4200
The new FT/IR-4000 series (FT/IR-4100 and FT/IR-4200) has been designed for general purpose analysis covering educational and routine analysis to research and development applications. The innovative hardware technology incorporated into this range of products provides a remarkable increase in the S/N ratio. The user friendly features of the new FT/IR-4000 series allows the operator to measure samples quickly and easily using the JASCO Quick Start System to perform routine measurements as well as automatic data processing functions all with a single push of a button. In addition, the optional expandability and upgradeability allows wavenumber extension to cover NIR to Far-IR applications, micro analysis with an FT-IR microscope, IR imaging with a multi-channel microscope and the rapid scan option.
The following software is included as standard with the new FT/IR-4000 Series.
- Spectra Manager II
- Validation software
- Quantitative software
Specifications
|
Specifications
|
FT/IR-4100
|
FT/IR-4200
|
|
|
Measurable W.N. range
|
7800 - 350 cm-1
15000 - 2200 cm-1(option, NIR model)
5000 - 220 cm-1(Option, Far-IR model)
|
|
Resolution
|
0.9, 2, 4, 8, 16 cm-1
|
0.5, 1, 2, 4, 8, 16 cm-1
|
|
Optical system
|
Single beam
|
|
Aperture diameter
|
Variable, 7.1, 5.0, 3.5, 2.5, 1.8, 1.2, 0.9, 0.5 mm diameter
|
|
Sample Compartment
|
Size: 175 mm (W) x 255 mm (D) x 170 mm (H)
Optical path: Center focus, light axis 70 mm high
|
|
Interferometer
|
45 ° Michelson interferometer, Corner cube mirror interferometer, with auto-alignment mechanism, sealed structure
|
|
Interferometer drive speed
|
AUTO, 1, 2, 3, 4 mm/sec
AUTO DLATGS 2.0 mm/sec
MCT (optional) 4.0 mm/sec
|
|
Rapid scan
|
Option (10 spectra/sec, 16 cm-1 resolution)
|
|
Beam splitter
|
Ge coated KBr substrates
CaF2 (option, NIR model)
CsI (option, Far-IR model)
|
|
Interferometer window material
|
KRS-5
|
|
Light source
|
High-intensity light source
Halogen lamp (option, NIR model)
|
|
Detector
|
DLATGS detector with Peltier element
MCT-N (- 750 cm-1, option)
MCT-M (- 650 cm-1, option)
MCT-W (- 450 cm-1, option)
InGaAs (option)
InSb (option)
Silicon-photodiode (option)
|
|
(Up to two detectors can be installed simultaneously.)
|
|
S/N ratio
|
22000:1
|
30000:1
|
|
|
(4 cm-1, 1 min, near 2200 cm-1, p-p measurement with KRS-5 window)
|
|
Wavenumber accuracy:
|
Within ± 0.01 cm-1 (theoretical value)
|
|
|
100%T line flatness
|
Within 100 +/- 1.0%T
(4,000 to 700 cm-1, continuous repetitive measurement)
|
|
|
GAIN switching
|
AUTO
1, 2, 4, 8, 16, 32, 64, 128, 256, 512
|
|
|
A/D converter
|
24 bit
|
|
|
Purging
|
Interferometer, Sample compartment/Detector
|
|
|
Communication
|
USB
|
|
|
Dimensions & Weight
|
460 (W) x 590 (D) x 290 (H) mm, 33 kg (main unit only),
200(W) x 285(D) x 85(H) mm, 4.7 kg (Power supply only)
|
|
|
Power requirement
|
AC 100~240 ± 10 V, 50 or 60Hz, 170VA
|
|
|
Data processing functions
|
|
|
Measurement
|
Parameter setting, sample name input, settings monitor, preview
|
|
|
Correction
|
Baseline correction, smoothing, elimination of extraneous peaks, deconvolution, FFT filtering, data interpolation and cut
|
|
|
Computation
|
Arithmetic operations, derivatives, KK conversion, difference spectrum (subtraction)
|
|
|
Peak processing
|
Peak detection, peak height, peak area, FWHM
|
|
|
Vertical axis conversion
|
KM conversion, Abs - %T
|
|
|
IR option
|
ATR correction, IF - spectrum , curve fitting
|
|
|
